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Sample Ion Milling 

Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron microscope observation.

ArBlade 5000
Ion Milling System

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

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IM4000Plus
Ion Milling System

The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.

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MC1000
Ion Sputter Coater

Designed and built to Hitachi’s extraordinary standards, the Hitachi MC1000 Ion Sputter Coater is poised to perform in your lab for years to come.

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